2011
DOI: 10.1016/j.microrel.2011.03.033
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High temperature CoSb3–Cu junctions

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Cited by 52 publications
(30 citation statements)
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“…Krzysztof Tomasz adopted Ni, Mo and Cr 80 Si 20 as the barrier layer in the SKD-Cu junctions, but the mismatched coefficient of thermal expansion (CTE) led to a potential mechanical problem [15]. Zhao et al reported the SKD-metal junctions, in which the electrode was made of Mo-Cu or W-Cu alloy and was jointed to SKD using Ti as the diffusion barrier [16,17].…”
Section: Introductionmentioning
confidence: 99%
“…Krzysztof Tomasz adopted Ni, Mo and Cr 80 Si 20 as the barrier layer in the SKD-Cu junctions, but the mismatched coefficient of thermal expansion (CTE) led to a potential mechanical problem [15]. Zhao et al reported the SKD-metal junctions, in which the electrode was made of Mo-Cu or W-Cu alloy and was jointed to SKD using Ti as the diffusion barrier [16,17].…”
Section: Introductionmentioning
confidence: 99%
“…17,18 The lifetime and the reliability of thermoelectric modules are also important. 19 Another aspect is materials that could provide heat transport from the heat source and to the heat sink.…”
Section: 3mentioning
confidence: 99%
“…16,17 These issues are not limited to PbTe but are present in other TE materials as well, such as CoSb 3 -based materials. 18,19 Severe diffusion and the brittleness of the chemical reaction products will undoubtedly lead to degradation of thermoelectric performance, which causes reliability problems during high-temperature operation. Consequently, appropriate bonding materials and fabrication methods should be developed for PbTe thermoelectric modules to allow for reliable long-term operation.…”
Section: Introductionmentioning
confidence: 99%