History-driven Compiler Fuzzing via Assembling and Scheduling Bug-triggering Code Segments

Fan, Zhenye; Ye, Guixin; Hu, Tianmin; Tang, Zhanyong

doi:10.1109/issre62328.2024.00040

2024 IEEE 35th International Symposium on Software Reliability Engineering (ISSRE) 2024

DOI: 10.1109/issre62328.2024.00040

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History-driven Compiler Fuzzing via Assembling and Scheduling Bug-triggering Code Segments

Zhenye Fan,

Guixin Ye,

Tianmin Hu

et al.

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History-driven Compiler Fuzzing via Assembling and Scheduling Bug-triggering Code Segments

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References 48 publications

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