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Fault localization (FL) aims to automatically find the location of bugs in a software program. In the family of FL approaches, spectrum‐based fault localization (SBFL) is the most widely used and has been extensively studied, which computes the suspicious scores of a code element to be buggy via test coverage information. Mutation‐based fault localization (MBFL) further analyses the relationship between mutants and test results. Although MBFL involves more information, it also faces the following limitations. (1) To precisely evaluate suspicious sources, SBFL approaches proposed dozens of formulae based on coverage, while only a few of them have been adopted by MBFL. (2) The current MBFL approaches are based on the assumption that the capability in localizing bugs of each mutant is the same, so they assign the same weight to the mutants that change the test outputs and consider the mutant from the same code element equivalent. In this paper, we intend to enrich the MBFL family by the following two approaches. First, we collect 25 typical SBFL formulae and transform them into MBFL versions. Second, we propose new assumptions that the mutants should have different weights in computing suspicious sources and propose BLMu, a novel MBFL approach that treats mutants differently. We also propose novel metrics for MBFL by considering the high cost of mutation analysis. We perform large‐scale experiments by evaluating all the MBFL approaches against 395 real‐world Java bugs of the Defects4J benchmark. Our evaluation results reveal that BLMu demonstrates a substantial improvement over both MUSE and Metallaxis, the most popular MBFL approaches, at both the statement level and the method level. Specifically, in terms of Top‐1, BLMu improves by 106% at the statement level and 69% at the method level. When compared with other types of FL approaches, MBFL outperforms typical SBFL approaches while still far behind the state‐of‐the‐art learning‐based FL approaches.
Fault localization (FL) aims to automatically find the location of bugs in a software program. In the family of FL approaches, spectrum‐based fault localization (SBFL) is the most widely used and has been extensively studied, which computes the suspicious scores of a code element to be buggy via test coverage information. Mutation‐based fault localization (MBFL) further analyses the relationship between mutants and test results. Although MBFL involves more information, it also faces the following limitations. (1) To precisely evaluate suspicious sources, SBFL approaches proposed dozens of formulae based on coverage, while only a few of them have been adopted by MBFL. (2) The current MBFL approaches are based on the assumption that the capability in localizing bugs of each mutant is the same, so they assign the same weight to the mutants that change the test outputs and consider the mutant from the same code element equivalent. In this paper, we intend to enrich the MBFL family by the following two approaches. First, we collect 25 typical SBFL formulae and transform them into MBFL versions. Second, we propose new assumptions that the mutants should have different weights in computing suspicious sources and propose BLMu, a novel MBFL approach that treats mutants differently. We also propose novel metrics for MBFL by considering the high cost of mutation analysis. We perform large‐scale experiments by evaluating all the MBFL approaches against 395 real‐world Java bugs of the Defects4J benchmark. Our evaluation results reveal that BLMu demonstrates a substantial improvement over both MUSE and Metallaxis, the most popular MBFL approaches, at both the statement level and the method level. Specifically, in terms of Top‐1, BLMu improves by 106% at the statement level and 69% at the method level. When compared with other types of FL approaches, MBFL outperforms typical SBFL approaches while still far behind the state‐of‐the‐art learning‐based FL approaches.
Automatic software fault localization plays an important role in software quality assurance by pinpointing faulty locations for easier debugging. Coverage-based fault localization is a commonly used technique, which applies statistics on coverage spectra to rank faulty code based on suspiciousness scores. However, statistics- based approaches based on formulae are often rigid, which calls for learning-based techniques. Amongst all, Grace, a graph-neural network (GNN) based technique has achieved state-of-the-art due to its capacity to preserve coverage spectra, i.e., test-to-source coverage relationships, as precise abstract syntax-enhanced graph representation, mitigating the limitation of other learning-based technique which compresses the feature representation. However, such representation is not scalable due to the increasing complexity of software, correlating with increasing coverage spectra and AST graph, making it challenging to extend, let alone train the graph neural network in practice. In this work, we proposed a new graph representation, DepGraph, that reduces the complexity of the graph representation by 70% in nodes and edges by integrating the interprocedural call graph in the graph representation of the code. Moreover, we integrate additional features—code change information—into the graph as attributes so the model can leverage rich historical project data. We evaluate DepGraph using Defects4j 2.0.0, and it outperforms Grace by locating 20% more faults in Top-1 and improving the Mean First Rank (MFR) and the Mean Average Rank (MAR) by over 50% while decreasing GPU memory usage by 44% and training/inference time by 85%. Additionally, in cross-project settings, DepGraph surpasses the state-of-the-art baseline with a 42% higher Top-1 accuracy, and 68% and 65% improvement in MFR and MAR, respectively. Our study demonstrates DepGraph’s robustness, achieving state-of-the-art accuracy and scalability for future extension and adoption.
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