2024
DOI: 10.1107/s1600576724006447
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AutoRefl: active learning in neutron reflectometry for fast data acquisition

David P. Hoogerheide,
Frank Heinrich

Abstract: Neutron reflectometry (NR) is a powerful technique for interrogating the structure of thin films at interfaces. Because NR measurements are slow and instrument availability is limited, measurement efficiency is paramount. One approach to improving measurement efficiency is active learning (AL), in which the next measurement configurations are selected on the basis of information gained from the partial data collected so far. AutoRefl, a model-based AL algorithm for neutron reflectometry measurements, is presen… Show more

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