“…Therefore, the actual advantage of LC-MS tools for on-line characterization of IMPs/DPs often had not been taken completely. However, the trend is changing, as evidenced in some very recent studies where the strategy similar to the one proposed by us [117] is being followed in principle [165,169,172,178,184]. Recently, some interesting features have been added in LC-MS instrumentation and controlling software like data dependent analysis (DDA), LC-MS E , mass defect filters (MDF and MMDF), 2D and 3D approaches, polarity switching, background-subtraction and noisereduction algorithms (BgS-NoRA).…”