2018 IEEE 23rd European Test Symposium (ETS) 2018
DOI: 10.1109/ets.2018.8400690
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IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers

Abstract: IEEE Std P1838 is the DfT standard-under-development for 3D test access into dies meant to be used in 3D multi-die stack assemblies. P1838 is the first DfT standard to include a flexible parallel port (FPP): an optional, scalable multi-bit ('parallel') test access mechanism, offering higher test access bandwidth compared to the mandatory one-bit ('serial') port. In this paper, we describe P1838's FPP and propose a formal FPP specification language based on Google's Protocol Buffers (PBs), that potentially coul… Show more

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Cited by 3 publications
(1 citation statement)
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“…In addition, there are several good papers and book chapters about the standard. Additional material is available in Marinissen et al, 16 Li et al, 17…”
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confidence: 99%