Abstract:IEEE Std P1838 is the DfT standard-under-development for 3D test access into dies meant to be used in 3D multi-die stack assemblies. P1838 is the first DfT standard to include a flexible parallel port (FPP): an optional, scalable multi-bit ('parallel') test access mechanism, offering higher test access bandwidth compared to the mandatory one-bit ('serial') port. In this paper, we describe P1838's FPP and propose a formal FPP specification language based on Google's Protocol Buffers (PBs), that potentially coul… Show more
“…In addition, there are several good papers and book chapters about the standard. Additional material is available in Marinissen et al, 16 Li et al, 17…”
“…In addition, there are several good papers and book chapters about the standard. Additional material is available in Marinissen et al, 16 Li et al, 17…”
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