2024 IEEE 42nd VLSI Test Symposium (VTS) 2024
DOI: 10.1109/vts60656.2024.10538776
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IEEE Std P3405: New Standard-under-Development for Chiplet Interconnect Test and Repair

Erik Jan Marinissen,
Vineet Pancholi,
Po-Yao Chuang
et al.
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