2021
DOI: 10.1038/s41699-020-00196-8
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Imaging and identification of point defects in PtTe2

Abstract: The properties and performance of two-dimensional (2D) materials can be greatly affected by point defects. PtTe2, a 2D material that belongs to the group 10 transition metal dichalcogenides, is a type-II Dirac semimetal, which has gained a lot of attention recently due to its potential for applications in catalysis, photonics, and spintronics. Here, we provide an experimental and theoretical investigation of point defects on and near the surface of PtTe2. Using scanning tunneling microscopy and scanning tunnel… Show more

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Cited by 35 publications
(38 citation statements)
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“…Furthermore, a direct correlation with the optical emission is missing. Even though STM is a tool able to identify atomic defects in 2D materials, 56,[93][94][95][96] STM/STS measurements of point defects in monolayer h-BN have not been reported yet.…”
Section: Electronic Structure and Light Emission Related To Point Def...mentioning
confidence: 99%
“…Furthermore, a direct correlation with the optical emission is missing. Even though STM is a tool able to identify atomic defects in 2D materials, 56,[93][94][95][96] STM/STS measurements of point defects in monolayer h-BN have not been reported yet.…”
Section: Electronic Structure and Light Emission Related To Point Def...mentioning
confidence: 99%
“…The topographic STM image of the MnBi 2 Te 4 flat terrace reveals randomly distributed triangular defects with an average density of the order of 3.4 − 5.2% (Fig. 2c and its inset), similar to those at the Te-terminated transition metal dichalcogenides surfaces 53 , as well as bright atomic-size protrusions, although much less abundant.…”
Section: Figure 1dmentioning
confidence: 76%
“…This is consistent with the circular shape of the features, suggesting that they are either incorporated in the surface Te layer or adsorbed on top of it. The bright appearance excludes the possibility of them being Te vacancies, which are usually resolved as depressions at Te-terminated surfaces 53,63 . The small measured apparent height of 0.5 Å at 1 V as well as the difficulty to manipulate it with the STM tip points towards the substitutional character of this defect.…”
Section: Figure 1dmentioning
confidence: 99%
“…Two terraces separated by terrace edge, which run vertically though the center of the image ( V = 1.0 V and I = 80 pA). STS measurements were performed at each of the 50 points along the 15 nm length blue line. , An I ( V ) curve was obtained for each point and differentiated with respect to the voltage. Figure c displays representative d I /d V spectra measured on and away from the step edge.…”
Section: Resultsmentioning
confidence: 99%
“…The primary motivation underpinning this study relates to the formation of defects on the surface, their evolution in time, and their effect on the electronic surface states. , Using ion bombardment, we can reduce the degree of order. This can result in anomalous monolayer planes and A-type bilayer steps coexisting with the B-type bilayer step, which dominate the pristine cleaved Bi(111) surface.…”
Section: Introductionmentioning
confidence: 99%