2004
DOI: 10.1109/mdt.2004.13
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Impact of design-manufacturing interface on SoC design methodologies

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Cited by 11 publications
(6 citation statements)
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“…Test, yield and reliability are of great importance to the profitability, safety and security of current SoCs [1]. This has increased the significance of test infrastructure and other infrastructure not directly related to system functionality [2].…”
Section: Introductionmentioning
confidence: 99%
“…Test, yield and reliability are of great importance to the profitability, safety and security of current SoCs [1]. This has increased the significance of test infrastructure and other infrastructure not directly related to system functionality [2].…”
Section: Introductionmentioning
confidence: 99%
“…While this divide-and-conquer approach drives development of each component separately, it has limitation in addressing a complex interaction among components. The lack of systematic perspective on the whole IC development components hinders rapid yield learning of the target process technology node [1]. It is distinguished especially in the technology node ramp.…”
Section: Introductionmentioning
confidence: 99%
“…Large-scale process variations have already become critical and can significantly impact circuit performance even for today's technologies [14,72,73,100]. Figure 1.1 shows the relative process variations (3σ/mean) predicted by the International Technology Roadmap for Semiconductors (ITRS) [100].…”
Section: Introductionmentioning
confidence: 99%
“…14 shows the characteristic functions for several typical random distributions. The above two properties imply an interesting…”
mentioning
confidence: 99%