2024 8th IEEE Electron Devices Technology &Amp;amp; Manufacturing Conference (EDTM) 2024
DOI: 10.1109/edtm58488.2024.10511944
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Impact of Gate Insulator Process on NBTI in FinFETs and Resulting Ring Oscillator Degradation Under Normal and Overclocking Usage Conditions

Arnav Shaurya Bisht,
Payel Chatterjee,
Souvik Mahapatra
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