Improved analogue fault coverage estimation using probabilistic analysis

Abstract

SUMMARYA method for fault detection probability estimation using statistical multi-parameter circuit simulation is proposed, in order to check circuits for which double or multiple analogue measurements are utilized. Theoretical analysis for the estimation of the fault coverage is given, based on conditional probability calculations. The proposed method can be applied for both test measurement and input stimulus selection. Simulation results from the application of the method on typical analogue circuits-filter and amplifierare given, showing a sufficient improvement over the fault coverage achieved by single measurements.

Soft‐fault diagnostic method based on locus circle of steady‐state node‐voltage vector

“…These issues have attracted the attention of many engineers [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18]. These issues have attracted the attention of many engineers [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18].…”

“…Some recent achievements have improved the diagnosis of soft faults. Many artificial intelligence methods and bionic designs have also been used to address the problem [6][7][8][9][10][11][12]. Another study of Kavithamani et al [19] used transfer function coefficients to identify faults in analog circuits because these coefficients are sensitive to the circuit parameters.…”

“…In other words, the fault feature SSNVVs of the same elements are on the same LCoSSNVV, and the fault feature SSNVVs of different elements are on different LCoSSNVVs. (6) Similar to the fault feature SSNVV numbers {4, 5,6,9,14,15,17,18,19,22,23, and 24} being on the LCoSSNVV of an intersection point, the faulty element is not easily distinguished by the fault feature SSNVV. The results are as follows ( Figure 19).…”

Analog Fault Detection Comparison between Supply Current and Output Voltage

“…Soft faults, on the other hand, are deviations of component parameters which result in performance out of acceptable limits. Compared to hard faults which happen due to excessive deviations, soft faults are by far more difficult to detect because they are caused by the deviations of component parameters [4].…”

“…Fault detection of analog circuits has been studied for many years and a lot of methods have been proposed [3][4][5][6][7][8][9][10][11][12]. Earlier works often study voltage measurement based methods and they have been used widely in the manufacture and other areas.…”