Improved noise parameters measurement for high frequency devices

Pasquet, Daniel; Descamps, Philippe; Lesénéchal, Dominique

doi:10.1109/telsks.2013.6704913

Cited by 1 publication

(3 citation statements)

References 13 publications

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“…Equation (26) results from (25) and the fact that a noise figure is always larger than one. It is important to note that with a linear regression technique based on (7), the coefficients c 1 to c 4 are determined without any restrictions and may possibly violate the consistency conditions (20)(21)(22). In the worst case, an attempt to calculate the noise parameters from the linear coefficients may even fail.…”

Section: Inconsistency Phenomenamentioning

confidence: 99%

“…In Figure 9, the FOUP achieved with the built-in regression algorithm is plotted versus frequency. Consistency violations are indicated by adding a penalty of 100% to FOUP (7). The inconsistencies are removed, and the mean square deviation significantly improved by the iterative optimization approach also plotted in Figure 9.…”

Section: Inconsistency Phenomenamentioning

confidence: 99%

“…Most commercial noise parameter measurement systems are still based on a noise source in combination with a mechanical tuner and cover a wide band; other approaches use narrow band sources and measurements or try to utilize the scaling properties of the device .…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

On the determination of noise parameters of low‐noise transistor devices

Seelmann‐Eggebert

Aja

Baldischweiler

et al. 2015

Int J Numerical Modelling

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In this paper, we discuss the experimental determination of noise parameters for high-electron-mobility transistor (HEMT) devices and analyze the problems encountered with conventional extraction techniques. HEMT devices are distinguished by a very small minimum noise figure of only a fraction of a dB, and this minimum noise is accomplished with a source reflection coefficient very close to the edge of the Smith chart. These properties impede a direct experimental determination of the optimum noise impedance by means of a tuner, and it has to be extrapolated from measurements of a large number of tuner states. Common linear regression techniques are found to yield erroneous results and even may fail completely to determine the noise parameters. We develop criteria to check the uncertainty of the result from the linear regression and show that, in general, the result needs to be examined for consistency. The occasional failure of extraction is traced back to a consistency violation in the conditions the elements of the correlation matrix need to satisfy. A new iterative technique is suggested for the extraction of noise parameters that warrants consistency. Moreover, a correction of the receiver gain is found to be necessary to obtain a good reproduction of the measured power patterns by the extracted noise parameters. This fact was attributed to thermal drift of the receiver

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Section: Inconsistency Phenomenamentioning

confidence: 99%

Section: Inconsistency Phenomenamentioning

confidence: 99%