Improved Scan Chain Stitching for Reducing Test Power

Annamareddy, Sai Sandeep; Mohan, Navya

doi:10.1109/discover62353.2024.10750747

2024 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics (DISCOVER) 2024

DOI: 10.1109/discover62353.2024.10750747

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Improved Scan Chain Stitching for Reducing Test Power

Sai Sandeep Annamareddy,

Navya Mohan

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Improved Scan Chain Stitching for Reducing Test Power

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References 15 publications

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