1998
DOI: 10.1007/bf02947166
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In-plane strains measurement by using the electronic speckle pattern interferometry

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Cited by 6 publications
(4 citation statements)
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“…The distribution of the processed image intensity is thinned by the linear interpolation (Kim et al, 1998). Suppose two adjacent thinned fringes of nand n + 1 order, and the displacements u of each fringes are given by (el-es) ,1 =nA n=O, 1,2, ... (7) and for the dark ones (8) In this paper, only Eq.…”
Section: Analysis Of Interferometric Fringementioning
confidence: 99%
See 1 more Smart Citation
“…The distribution of the processed image intensity is thinned by the linear interpolation (Kim et al, 1998). Suppose two adjacent thinned fringes of nand n + 1 order, and the displacements u of each fringes are given by (el-es) ,1 =nA n=O, 1,2, ... (7) and for the dark ones (8) In this paper, only Eq.…”
Section: Analysis Of Interferometric Fringementioning
confidence: 99%
“…Some researchers (Shchepinov et al, 1996;Kim et al, 1998;Lq;kberg et al, 1985) proposed an electronic speckle pattern interferometry method (ESPI) that can measure displacements without the preparation of the structure surface. In this study, we used ESPI to measure the thermal strain at high temperature.…”
Section: Introductionmentioning
confidence: 99%
“…Among them, electronic speckle pattern interferometry (ESPI) is a technique that is very attractive in optical metrology not only for its noncontact nature but also for its relative speed. This is mainly due to the use of video detection and digital image processing [5,6]. The application of digital techniques in ESPI allows the automation of the data analysis process, which is usually based on the extraction of the optical phase distribution encoded by the generated correlation fringes.…”
Section: Introductionmentioning
confidence: 99%
“…To find the practical aspect of these problems, we have measured the vibration modes of rectangular plates clamped at two parallel edges by ESPI (Cloud, 1995;Ennos, 1975;Jones and Wykes, 1989), which is developed in recent years. ESPI (Electronic Speckle Pattern Interferometry) (Kang and Moon, 1996;Kim and Yang, 1994;Kim et a\., 1998) tion and the computer image processing to SPI, is a new method for the analysis of the vibration problems (Kang and Choi, 1996;Rastogi, 1997;Sirohi, 1993). In this paper, vibration modes are measured for each excitation point and aspect ratio of the specimen.…”
Section: Introductionmentioning
confidence: 99%