2017
DOI: 10.1021/acsami.7b03024
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In Situ Visualized Cathode Electrolyte Interphase on LiCoO2 in High Voltage Cycling

Abstract: Charging lithium ion battery cathode materials such as LiCoO to a higher voltage may simultaneously enhance the specific capacity and average operating voltage and thus improve the energy density. However, battery cycle life is compromised in high voltage cycling due to lattice instability and undesired oxidation of electrolyte. Cathode solid-electrolyte interphase (SEI), or cathode-electrolyte interphase (CEI), in situ formed at the cathode-electrolyte interface under high voltage, is critically important in … Show more

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Cited by 123 publications
(97 citation statements)
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“…d) In situ AFM images of the CEI formation on the edge plane of LiCoO 2 crystal. Copyright 2017, American Chemical Society . AFM, atomic force microscopy; CEI, cathode electrolyte interphase; ESM, electrochemical strain microscopy.…”
Section: Positive Electrode Materials In Libsmentioning
confidence: 99%
See 2 more Smart Citations
“…d) In situ AFM images of the CEI formation on the edge plane of LiCoO 2 crystal. Copyright 2017, American Chemical Society . AFM, atomic force microscopy; CEI, cathode electrolyte interphase; ESM, electrochemical strain microscopy.…”
Section: Positive Electrode Materials In Libsmentioning
confidence: 99%
“…No CEI can be observed on basal planes or edge planes with thin Al 2 O 3 coating on LiCoO 2 microcrystals. It is revealed that thin Al 2 O 3 coating can prevent the interfacial reaction, stabilize interface catalytic activity, and improve the high voltage stability of LiCoO 2 cathode . Wu et al.…”
Section: Positive Electrode Materials In Libsmentioning
confidence: 99%
See 1 more Smart Citation
“…Copyright 2001, Electrochemical Society. e,f) In situ AFM topographical image of basal plane of LiCoO 2 cathode before (e) and after (f) charging to 4.50 V. g,h) In situ AFM topographical image of edge plane of LiCoO 2 cathode before (g) and after (h) charging to 4.50 V. e–h) Reproduced with permission . Copyright 2017, American Chemical Society.…”
Section: Energy Storage Devicesmentioning
confidence: 99%
“…Especially when the sample was charged to 4.50 V, a fibrillary thin film covered the surface of the edge plane (Figure g,h). The formation of the CEI on edge planes can be completely suppressed by atomic layer deposited thin Al 2 O 3 layer, which was correlated with improved stability of coin cells in high voltage cycling …”
Section: Energy Storage Devicesmentioning
confidence: 99%