Fifteenth International Conference on Correlation Optics 2021
DOI: 10.1117/12.2615854
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Influence of defect structure on characteristics of X- and γ-radiation detectors based on CdTe:Cl according to high-resolution X-ray diffractometry

І. М. Фодчук
1
,
A. Kuzmin
2
,
O. L. Maslyanchuk
3
et al.
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