2022
DOI: 10.15330/pcss.23.1.144-149
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Influence of dislocation structure on electrical and spectroscopic properties of MoOx/p-CdTe/MoOx heterostructures

Abstract: The defective structure of p-CdTe:Cl single crystals and MoOx/p-CdTe/MoOx heterostructures were investigated by high-resolution X-wave diffractometry methods. Different models of dislocation systems were used and the dislocation densities were estimated from the Williamson-Hall plot. It is noted that significant deformations of the mismatch in the transition layer negatively affect the current–voltage characteristics of heterostructures.

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“…As seen, the dark current of the heterostructure No 2 quite low and linearly proportional to bias voltage in the voltage range 0 < V < 20 V (Fig. 3 MoOx/CdTe:Cl/MoOx detectors are sensitive to X-and γ-ray radiation, which are similar to novel Schottky-diode detectors with electrodes made of Ti, Mo, and oxides or nitride of these metals 18,19 , and also detectors made as Schottky diodes using ion-bombardment of the crystal surface before Ni electrode deposition or formed as M-p-n diode structures by laser-induced doping with In. The γ-radiation spectrum of 241 Am (59.5 keV) source measured at V = -18 V using the MoOx/CdTe:Cl/MoOx based on the "mosaic" (sample No 2) and "perfect" (sample No 1) substrates at room temperature is shown in Fig.…”
Section: Electrical and Spectroscopic Properties Of Moox/cdte:cl/moox...mentioning
confidence: 89%
“…As seen, the dark current of the heterostructure No 2 quite low and linearly proportional to bias voltage in the voltage range 0 < V < 20 V (Fig. 3 MoOx/CdTe:Cl/MoOx detectors are sensitive to X-and γ-ray radiation, which are similar to novel Schottky-diode detectors with electrodes made of Ti, Mo, and oxides or nitride of these metals 18,19 , and also detectors made as Schottky diodes using ion-bombardment of the crystal surface before Ni electrode deposition or formed as M-p-n diode structures by laser-induced doping with In. The γ-radiation spectrum of 241 Am (59.5 keV) source measured at V = -18 V using the MoOx/CdTe:Cl/MoOx based on the "mosaic" (sample No 2) and "perfect" (sample No 1) substrates at room temperature is shown in Fig.…”
Section: Electrical and Spectroscopic Properties Of Moox/cdte:cl/moox...mentioning
confidence: 89%