Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy

Hirose, Masakazu; Tsunemi, Eika; Kobayashi, Kei; Yamada, Hirofumi

doi:10.1063/1.4826582

Cited by 15 publications

(13 citation statements)

References 28 publications

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“…Varying the distance of the resistance measurement with respect to an in-plane electrode, the resistance across a grain boundary was found to be large compared to the resistance of a grain for both sexithiophene [16] and pentacene [143]. Similar results were found using two SFM probes also for sexithiophene [15]. Charge trapping can be significantly reduced when additional organic layers are introduced [144].…”

Section: Electronic Properties-local Work Functionsupporting

confidence: 64%

“…A third contact needed to build a transistor is difficult to integrate. Amongst the efforts to connect electric leads to molecules [14], an alternative approach is to use several probes to study electronic transport through the molecule in an in-plane configuration [15]. Such in-plane contacts are much more stable than STM configuration [16].…”

Section: Introductionmentioning

confidence: 99%

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Imaging prototypical aromatic molecules on insulating surfaces: a review

Hoffmann‐Vogel

2017

Rep. Prog. Phys.

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Insulating substrates allow for in-plane contacted molecular electronics devices where the molecule is in contact with the insulator. For the development of such devices it is important to understand the interaction of molecules with insulating surfaces. As substrates, ionic crystals such as KBr, KCl, NaCl and CaF are discussed. The surface energies of these substrates are small and as a consequence intrinsic properties of the molecules, such as molecule-molecule interaction, become more important relative to interactions with the substrates. As prototypical molecules, three variants of graphene-related molecules are used, pentacene, [Formula: see text] and PTCDA. Pentacene is a good candidate for molecular electronics applications due to its high charge carrier mobility. It shows mainly an upright standing growth mode and the morphology of the islands is strongly influenced by dewetting. A new second flat-lying phase of the molecule has been observed. Studying the local work function using the Kelvin method reveals details such as line defects in the center of islands. The local work function differences between the upright-standing and flat-lying phase can only be explained by charge transfer that is unusual on ionic crystalline surfaces. [Formula: see text] nucleation and growth is explained by loosely bound molecules at kink sites as nucleation sites. The stability of [Formula: see text] islands as a function of magic numbers is investigated. Peculiar island shapes are obtained from unusual dewetting processes already at work during growth, where molecules 'climb' to the second molecular layer. PTCDA is a prototypical semiconducting molecule with strong quadrupole moment. It grows in the form of elongated islands where the top and the facets can be molecularly resolved. In this way the precise molecular arrangement in the islands is revealed.

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Section: Electronic Properties-local Work Functionsupporting

confidence: 64%

Section: Introductionmentioning

confidence: 99%

Imaging prototypical aromatic molecules on insulating surfaces: a review

Hoffmann‐Vogel

2017

Rep. Prog. Phys.

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“…5), but observation when they are very close is not available. We next plan to take advantage of the features of stable movement at the nanoscale order for the tube actuator used in the present research, introduce a mechanism to control the distance between the probes to maintain a stable proximity state at a range of 1 μm or less between the probes [6], and then evaluate semiconductor devices subjected to fine processing [18] and perform observations of biological specimens in a liquid environment [19].…”

Section: Observation Results and Evaluation Of The Distance Between Pmentioning

confidence: 99%

Twin‐Probe Atomic Force Microscopy with Optical Beam Deflection Using Vertically Incident Lasers by Two Beam Splitter

Satoh

Tsunemi

Kobayashi

et al. 2016

Elect Comm in Japan

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We developed a twin-probe atomic force microscopy (AFM) system using Si cantilever-probes. The system utilizes the optical beam deflection method in order to detect the deflection of each cantilever-probe mounted on each tube-type actuator. The cantilever-probes mounted on each actuator are able to realize independent control of the probe positions, which are attached to manual sliders. A sensitivity 90 fm/ √ H z or less is achieved for the displacement sensor activity for the two cantilever-probes. We succeeded in the simultaneous observation of a topographic image in the state in which they approached each other to within 40 μm. C⃝ 2016 Wiley Periodicals, Inc. Electron Comm Jpn, 99(9): 92-100, 2016; Published online in Wiley Online Library (wileyonlinelibrary.com).

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“…In order to guide the tip to the conducting areas an AFM operation, instead of or in addition to SEM guided positioning of the tips, can be very useful. 6,13 The integration of a multi-tip STM in a cryostat with a superconducting magnet would be a big step. With this upgrade to magnetic field operation, the full capabilities of magnetotransport measurements such as Hall effect, weak (anti-) localization, and Shubnikov-de-Haas oscillations will become available at the nanoscale, with the additional flexibility to reposition the probes.…”

Section: Discussionmentioning

confidence: 99%

“…This result can also be understood from the analytic equation [Eq. (13)]. For a given aspect ratio of a cylinder (L/D), the bending resonance frequency scales as ∝1/L.…”

Section: Tips For Multi-tip Stmmentioning

confidence: 99%

Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis

Voigtländer

Cherepanov

Korte

et al. 2018

Review of Scientific Instruments

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In scanning tunneling microscopy, we witness in recent years a paradigm shift from "just imaging" to detailed spectroscopic measurements at the nanoscale and multi-tip scanning tunneling microscope (STM) is a technique following this trend. It is capable of performing nanoscale charge transport measurements like a "multimeter at the nanoscale." Distance-dependent four-point measurements, the acquisition of nanoscale potential maps at current carrying nanostructures and surfaces, as well as the acquisition of I − V curves of nanoelectronic devices are examples of the capabilities of the multi-tip STM technique. In this review, we focus on two aspects: How to perform the multi-tip STM measurements and how to analyze the acquired data in order to gain insight into nanoscale charge transport processes for a variety of samples. We further discuss specifics of the electronics for multi-tip STM and the properties of tips for multi-tip STM, and present methods for a tip approach to nanostructures on insulating substrates. We introduce methods on how to extract the conductivity/resistivity for mixed 2D/3D systems from four-point measurements, how to measure the conductivity of 2D sheets, and how to introduce scanning tunneling potentiometry measurements with a multi-tip setup. For the example of multi-tip measurements at freestanding vapor liquid solid grown nanowires, we discuss contact resistances as well as the influence of the presence of the probing tips on the four point measurements.

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Influence of grain boundary on electrical properties of organic crystalline grains investigated by dual-probe atomic force microscopy

Cited by 15 publications

References 28 publications

Imaging prototypical aromatic molecules on insulating surfaces: a review

Imaging prototypical aromatic molecules on insulating surfaces: a review

Twin‐Probe Atomic Force Microscopy with Optical Beam Deflection Using Vertically Incident Lasers by Two Beam Splitter

Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis

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