Infrared micro optical reflectance spectra of InN

Abstract

Micro optical reflecance measurements of InN films have been performed at middle and near infrared region. Spectrum line shape fitting calculation based on theoretical formula which takes account of the coupling between LO phonons and plasmons have been also performed. Small area reflectance spectra (50 μm × 50 μm) at every points in the field of microscope vision show both similar and different line shapes by wavenumber location. The different part is mainly responsible for plasmon relaxation time which directly correspond to the carrier mobility. Comparison among contour image map of the fitting parameters and visible image is also presented. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)