2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2023
DOI: 10.1109/ipfa58228.2023.10249051
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Integration of Soft Defect Localization (SDL) and Electro-Optical Probing (EOP) in Root Cause Investigation for Time Delay Related Issue

Foo Loke Sheng,
Chua Thin Wei,
Tan Ley Teng
et al.
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