Intermittent Faults: A Model and a Detection Procedure

Kamal, Swatabdi; Page, Carl V.

doi:10.1109/t-c.1974.224019

Cited by 55 publications

(13 citation statements)

References 7 publications

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“…The e ect of intermittent faults on the reliabilit y of digital systems was studied by Prasad ( 1990 ). A number of research papers has been published in the literature regarding models and testing procedures for single and or double intermittent faults ( Bruer 1973, Kamal and Page 1975, Agrawal and Jain 1985, Nakagaw a and Yasui 1989, Nakagw a et al 1992 ). In Nakagaw a and Yasui (1989 ) periodic tests for intermittent faults are scheduled at times KT (K=1,2, ¼ ).…”

Section: Introductionmentioning

confidence: 99%

Statistical analysis of multiple intermittent faults in combinational circuits

Abd-El-Barr¹,

Ansari²

1996

International Journal of Electronics

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Statistical analysis of multiple intermittent faults (SAMIFs) is proposed as a method for estimating the detection probabilities and fault coverage of multiple intermittent faults in combinational circuits. SAMIFs involves the concurrent simulation of multiple intermittent faults and an estimation of the controllability and observability values for each node of the faulty circuit for a given set of input vectors. The controllabilities and observabilities are then used to derive estimates of the fault-detection probabilities and the overall fault coverage. An algorithm for estimating the fault coverage of a pseudo-random test vector set over a set of multiple intermittent faults in a combinational circuit is also proposed. Experimental results obtained from applying the algorithm to a number of benchmark circuits are also presented.

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Section: Introductionmentioning

confidence: 99%

Statistical analysis of multiple intermittent faults in combinational circuits

Abd-El-Barr¹,

Ansari²

1996

International Journal of Electronics

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“…A major problem is faced due to intermittent faults: they are difficult to detect; they can only be detected if an appropriate test is applied to the circuit during a period when the fault occurs (Breuer 1973, Kamal andPage 1974); and tests must be applied repeatedly to detect these faults. Modelling of intermittent faults requires statistical data on their probability of occurrence (Breuer 1973).…”

Section: Introductionmentioning

confidence: 99%

Modelling and fault detection in microelectronic technologies

Ismaeel¹,

Bhatnagar²

1995

International Journal of Electronics

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The modelling and testing of microelectronic circuits for difkrent technologies are presented. Rapid developments in these technologies have compelled the issue of reliability to become extremely important. A study of these developments, the commonly used microelectronic technologies, the causes of their failures and the circuit models are presented. The circuits are modelled at either the gate level or at the transistor level. Transistor-level modelling is given more emphasis because of some shortcomings in gate-level modelling. The transistor-level model assumes four logic values (0, 1, I, M), where I and M imply an intermediate logical value and a memory element, respectively. Both classical stuck-at faults and non-classical transistor stuck faults can be analysed using the model. An algorithm that is based on a modified version of the Boolean difTerence technique is applied to obtain test vectors. Primitive D-cubes of the fault are extracted for the specified subcircuit. To generate tests for single or multiple faults, a variant of the D-algorithm may be used.

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“…One [22], and Su [11], while discrete-time models have been used by Kamal [6], [7], Koren [ 10], and Savir [ 15]- [20]. The testing strategies can be categorized as either deterministic or probabilistic in nature.…”

Section: Introductionmentioning

confidence: 99%

“…The testing strategies can be categorized as either deterministic or probabilistic in nature. Kamal [6], [7] and Koren [10] describe properties of deterministic test procedures, while Savir [15]- [20] describes random test procedures for detecting IF's.…”

Section: Introductionmentioning

confidence: 99%