Abstract:Interferometric measuring systems are frequently used in determining the precise changes. The light of the venture property is used in this system which is possible to perform measurements in the nanometer precision. Analysis of data, which are taken from interferometric measurement systems, can be performed by fringe counting, image processing. There are disadvantages of such kinds of methods which are cost, time and design challenge. The most innovation in our study, the need of electronic circuit or image p… Show more
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