2019
DOI: 10.1016/j.infrared.2019.05.016
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Investigations for inclination angle characterization of angular defects using eddy current pulsed thermography

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Cited by 7 publications
(4 citation statements)
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“…However, this location changes at different frames due to measurement errors and uncertainty. Similar to previous work [22], the characteristic location of the maximum thermal pixel is statistically found by repeated tests, as shown in Fig. 5(b).…”
Section: Feature Extraction and Comparisonsupporting
confidence: 81%
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“…However, this location changes at different frames due to measurement errors and uncertainty. Similar to previous work [22], the characteristic location of the maximum thermal pixel is statistically found by repeated tests, as shown in Fig. 5(b).…”
Section: Feature Extraction and Comparisonsupporting
confidence: 81%
“…These two features are derived from the thermal distribution at the end of the heating stage and denoted as SST and SKT. The detailed calculation process can be found in [22], the only difference is that the thermal responses of the pixels are preprocessed by zero-lag filtering.…”
Section: ) Spatial Skewness-and Kurtosis-based Featuresmentioning
confidence: 99%
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“…Active infrared thermography technology is a fast, noncontact detection method. The method can be divided into halogen lamp excitation [12], eddy current excitation [13], laser excitation [14], ultrasonic excitation [15], microwave excitation [16], resistive heating and mechanical vibrations excitation according to different heating excitation. And this method can be divided into reflection type and transmission type due to the different placement of the infrared imager.…”
Section: Iintroductionmentioning
confidence: 99%