2023 IEEE XVI International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering (APEIE) 2023
DOI: 10.1109/apeie59731.2023.10347794
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iOk Platform for Automated Object Detection and Analysis in Microscopy Images

Vitalii Yu. Kudinov,
Andrey V. Matveev,
Anna V. Nartova
et al.
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