Radiation Effects and Defects in Solids
 2015
DOI: 10.1080/10420150.2015.1052433
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Ionizing radiation effects on electrical and reliability characteristics of sputtered Ta2O5/Si interface

Ashwath Rao
1
,
Ankit Verma
2
,
Bhawna Singh
3
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Cited by 6 publications
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A study on the gamma and swift heavy ion irradiation-induced effects on the electrical properties of TaO -based MOS capacitors

Goud,
Akkanaboina,
Machiboyina
et al. 2024
Nuclear Instruments and Methods in Physics Research Section B:
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A study on the gamma and swift heavy ion irradiation-induced effects on the electrical properties of TaO -based MOS capacitors

Goud,
Akkanaboina,
Machiboyina
et al. 2024
Nuclear Instruments and Methods in Physics Research Section B:
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The gamma irradiation responses of yttrium oxide capacitors and first assessment usage in radiation sensors

Abubakar
1
,
Kaya
2
,
Karaçalı
3
et al. 2017
Sensors and Actuators A: Physical
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Gamma-ray irradiation-induced oxidation and disproportionation at the amorphous SiO2/Si interfaces

Meng
1
,
Lan
2
,
Yang
3
et al. 2020
J. Mater. Chem. C
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