Isothermal differential dilatometry based on X-ray analysis applied to stress relaxation in thin ion-beam-sputtered Pt films

Gruber, Wolfgang; Baehtz, Carsten; Geue, Thomas; Stahn, J.; Schmidt, Harald

doi:10.1007/s10853-016-0458-7

J Mater Sci

2016

DOI: 10.1007/s10853-016-0458-7

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Isothermal differential dilatometry based on X-ray analysis applied to stress relaxation in thin ion-beam-sputtered Pt films

Wolfgang Gruber

Carsten Baehtz

Thomas Geue

et al.

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Isothermal differential dilatometry based on X-ray analysis applied to stress relaxation in thin ion-beam-sputtered Pt films

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References 44 publications

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