“…AFM can also be applied to manipulate, especially cut samples at nanometric scale (Irmer et al, 1998;Jin and Unertl, 1992;Magno and Bennet, 1997;Sumomogi et al, 1994;Thalhammer et al, 1997;Yu et al, 2005). Light microscopy is affected by limited resolution, which imposes undesirable restrictions to research activities (Stanislav, 2005).…”