1998
DOI: 10.1063/1.122364
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Josephson junctions defined by a nanoplough

Abstract: We define superconducting constrictions by ploughing a deposited Aluminum film with a scanning probe microscope. The microscope tip is modified by electron beam deposition to form a nano-plough of diamond-like hardness what allows the definition of highly transparent Josephson junctions. Additionally a dc-SQUID is fabricated in order to verify the junctions behaviour. The devices are easily integrated in mesoscopic devices as local radiation sources and can be used as tunable on-chip millimeter wave sources.

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Cited by 58 publications
(38 citation statements)
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“…Already in 1987, McCord and Pease demonstrated that a calcium fluoride film can be mechanically scratched with an SPM tip, resulting in 360 nm wide lines [8]. Later, amazing nanodevices were fabricated by scratching [9][10][11][12]. Closely related to this method is the mechanical scratching of a resist layer, followed by a subsequent etching step [9,13].…”
Section: Introductionmentioning
confidence: 99%
“…Already in 1987, McCord and Pease demonstrated that a calcium fluoride film can be mechanically scratched with an SPM tip, resulting in 360 nm wide lines [8]. Later, amazing nanodevices were fabricated by scratching [9][10][11][12]. Closely related to this method is the mechanical scratching of a resist layer, followed by a subsequent etching step [9,13].…”
Section: Introductionmentioning
confidence: 99%
“…Another technology is given by the local electrochemical oxidation of the surface using a voltage biased tip [9][10][11][12][13][14][15][16][17]. In this paper, we will focus on this latter technique although SQUIDs have been successfully obtained using the former one [6].…”
Section: Introductionmentioning
confidence: 99%
“…As an example, one can cite the tip indentation patterning that takes advantage of the local tip-surface mechanical interaction leading to a surface scratching [4][5][6]). Another technology is given by the local electrochemical oxidation of the surface using a voltage biased tip [9][10][11][12][13][14][15][16][17].…”
Section: Introductionmentioning
confidence: 99%
“…AFM can also be applied to manipulate, especially cut samples at nanometric scale (Irmer et al, 1998;Jin and Unertl, 1992;Magno and Bennet, 1997;Sumomogi et al, 1994;Thalhammer et al, 1997;Yu et al, 2005). Light microscopy is affected by limited resolution, which imposes undesirable restrictions to research activities (Stanislav, 2005).…”
Section: Introductionmentioning
confidence: 96%