2008
DOI: 10.1016/j.jcrysgro.2008.08.019
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Kinetic analysis of surface adsorption layer for InGaAsP-related binary materials using in situ RAS

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Cited by 4 publications
(1 citation statement)
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“…Multinary epilayers may be used as active parts of the device (such as InGaAsP‐based absorbers), as barrier layers to tune the band alignment, or simply as transition layers, for instance, to bridge lattice mismatch between two materials by graded buffers . It is often useful to study constituents of multinary compounds individually . For multinary compounds, optical real‐time analysis can contribute to “control of thickness and stoichiometry during growth as well as monitoring the switching procedures during the growth of heterostructures.” For example, the MOVPE growth of entire laser and MJSC structures can be monitored in situ with RAS .…”
Section: Epitaxial Reference Surfacesmentioning
confidence: 99%
“…Multinary epilayers may be used as active parts of the device (such as InGaAsP‐based absorbers), as barrier layers to tune the band alignment, or simply as transition layers, for instance, to bridge lattice mismatch between two materials by graded buffers . It is often useful to study constituents of multinary compounds individually . For multinary compounds, optical real‐time analysis can contribute to “control of thickness and stoichiometry during growth as well as monitoring the switching procedures during the growth of heterostructures.” For example, the MOVPE growth of entire laser and MJSC structures can be monitored in situ with RAS .…”
Section: Epitaxial Reference Surfacesmentioning
confidence: 99%