1983
DOI: 10.2172/5768737
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Kirkpatrick-Baez x-ray-microscope optimization for inertial-confinement-fusion applications

Abstract: TUi bu WHMI rtaart IMM Btfcaarl; far Uml ar Date* n tonal aJrtrfcarlaa. IW ifhliw ari codnlHa •Met art *ow sf *e iMkor *BJ ••} or auy sol»t Owe of Use Lslaratery. Wark pcrfuMs* m4tt tke tqlca »r tkc VS. DeautaKat of Eiojj bj tic Lawrracc Lircnen Ukoruci) safer CoMrKt W-7«5-E»t-«S.

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Cited by 4 publications
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