Large‐Area Metal–Organic Framework Glasses for Efficient X‐Ray Detection

Abstract

Cutting‐edge techniques utilizing continuous films made from pure, novel semiconductive materials offer promising pathways to achieve high performance and cost‐effectiveness for X‐ray detection. Semiconductive metal–organic framework (MOF) glass films are known for their remarkably smooth surface morphology, straightforward synthesis, and capability for large‐area fabrication, presenting a new direction for high‐performance X‐ray detectors. Here, a novel material centered on MOF glasses for highly uniform glass film fabrication customized for X‐ray detection is introduced. MOF glasses, composed of zinc and imidazole derivatives, enable the transition from solid to liquid at low temperatures, facilitating the straightforward preparation of large‐area and continuous MOF films with high mobility for X‐ray device fabrication. Remarkably, MOF glass detectors demonstrate an exceptional sensitivity of 112.8 µC Gyair−1 cm−2 and a detection limit of 0.41 µGyair s−1, making them one of the most sensitive and with the best detection limits reported to date for MOF X‐ray detectors. Clear X‐ray images are successfully conducted using these developed MOF glass detectors for the first time. This breakthrough in X‐ray sensitivity, and detection limit along with the spatial imaging resolution establishes a new standard for developing large‐area and efficient MOF‐based X‐ray detectors with practical applications in medical and security screening.