Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference, 2005.
DOI: 10.1109/pvsc.2005.1488373
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Laser processing of crystalline silicon solar cells

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Cited by 12 publications
(13 citation statements)
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“…Saturation occurs when the process becomes source limited: under these conditions the number of dopant atoms and not the melting time limits the diffusion process. Increased SHR for increasing diode current (above some threshold current) was observed by others [31] and could be explained by evaporation of silicon with dopants during ablation or a decrease of doping homogeneity. Fig.…”
Section: Sample Preparationsupporting
confidence: 57%
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“…Saturation occurs when the process becomes source limited: under these conditions the number of dopant atoms and not the melting time limits the diffusion process. Increased SHR for increasing diode current (above some threshold current) was observed by others [31] and could be explained by evaporation of silicon with dopants during ablation or a decrease of doping homogeneity. Fig.…”
Section: Sample Preparationsupporting
confidence: 57%
“…High efficiencies using different substrates and SODs have been obtained using this method [30][31][32]. It is worth noting that the laser doping process can be employed for a variety of applications, including formation of a large area emitter [31,33], selective emitter [8,30,[34][35] and Back Surface Field (BSF) [17,36].…”
Section: Introductionmentioning
confidence: 99%
“…They speculated that the formation of stacking faults results from a single mistake in the stacking of atoms during the crystal growth 6. Defect‐free recrystallised zones were also achieved using different types of lasers 7, 8.…”
Section: Introductionmentioning
confidence: 99%
“…Rapid cooling was found to create such defects, which severely limit the carrier lifetime in the recrystallised area 9, 10. In solar cells these point defects lower the minority carrier lifetime and hence the open circuit voltage 11, 15, 16. The critical recrystallisation velocity was determined to be 1–1.5 m/s; velocities above this value produce high levels of defects 17, 18.…”
Section: Introductionmentioning
confidence: 99%
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