Abstract:The rapidly emerging perovskites hold immense potential for revolutionizing optoelectronic and photovoltaic applications. However, understanding the complex structural dynamics and their response at extreme conditions in robust environments is crucial for optimizing the practical performance of perovskite‐based devices. Previous X‐ray diffraction studies have shown great potential for studying the average structures of these materials, but for more complex analysis at the local atomic level, Raman spectroscopy… Show more
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