LaVA: An Effective Layer Variation Aware Bad Block Management for 3D CT NAND Flash

Bai, Shuhan; Zhou, You; Wu, Fei; Xie, Changsheng; Kuo, Tei-Wei; Xue, Chun Jason

doi:10.23919/date58400.2024.10546546

2024 Design, Automation &Amp;amp; Test in Europe Conference &Amp;amp; Exhibition (DATE) 2024

DOI: 10.23919/date58400.2024.10546546

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LaVA: An Effective Layer Variation Aware Bad Block Management for 3D CT NAND Flash

Shuhan Bai,

You Zhou,

Fei Wu

et al.

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LaVA: An Effective Layer Variation Aware Bad Block Management for 3D CT NAND Flash

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References 23 publications

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