Lifetime Performance Evaluation of Electronic Products with Censored Data

Abstract

As research-and-development technologies advance, increasing product lifetime performance becomes a crucial research topic. The lifetime performance index is used to evaluate product performance and improve quality and productivity. Censoring represents a means of shortening research-and-development time. Assuming that product lifetime follows an exponential distribution, we used the lifetime performance index and type-I right censoring to evaluate product lifetime performance. The maximum likelihood estimator is used to estimate the lifetime performance index based on the type-I right censored sample and the asymptotic distribution of estimator. We then find the level (1-α)⋅100% one-sided confidence interval for lifetime performance index, and establish the uniformly most powerful (UMP) test of the product lifetime performance index. As a demonstration of the applicability of this approach, we present a practical example in which we confirm process capability.

Fuzzy Evaluation Model for Lifetime Performance Using Type-I Censoring Data

“…Based on Buckley's approach [29], Equations ( 20) and ( 21), the -cuts  of the triangular fuzzy number 0 ˆL  is denoted by the following equation [16,17]:…”

“…where Z F is a cumulative distribution function of the standard normal distribution. Subsequently, the curves of () gx and () c gx are depicted below: Based on Buckley [29] and Chiou [17], we let R A be the area in the curved graph of () c gx and be defined as…”

“…Building upon this assumption, some studies have proposed a relative lifetime performance index to offer the industry a more intuitive and user-friendly tool in practice [14][15][16]. According to Chiou [17] and Chen and Yu [16], the relative electronic component lifetime is denoted with X = T/L, where L represents the period of warranty. Thus, the relative electronic component lifetime X possesses a Gamma distribution with two parameters, 1 and L  , expressed as X~ (1, ) L G  .…”

“…Since this index has unknown parameters, it must be evaluated using sample data. However, Chiou [17] stated that it is time-consuming to obtain electronic products' lifetime data. In addition, often complete samples cannot be obtained.…”

“…Applying these two numbers should be taken into consideration for fuzzy testing. Therefore, the rules for fuzzy testing are established below[17]:(1) If   1  then 0 H is rejected and L…”