Light emitting diode degradation and failure occurrence modelling based on accelerated life test

Vališ, David; Forbelská, Marie; Vintr, Zdeněk; La, Quoc Tiep; Kohl, Zdeněk

doi:10.1016/j.engfailanal.2024.109200

Engineering Failure Analysis

2025

DOI: 10.1016/j.engfailanal.2024.109200

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Light emitting diode degradation and failure occurrence modelling based on accelerated life test

David Vališ,

Marie Forbelská,

Zdeněk Vintr

et al.

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Light emitting diode degradation and failure occurrence modelling based on accelerated life test

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References 33 publications

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