Line scanning confocal microscopy with the use of cross structured illumination

Abstract

In this paper, we propose new SI method, the cross SI method that improves the lateral resolution and the image acquisition speed. The cross SI pattern is generated by using the 2-D diffractive grating. The acquisition of a total of 6 raw images shortens the image acquisition time. The cross structured illumination confocal microscope (CSICM) is combined with the cross SI pattern generation optics and the line scanning confocal microscope. Performances of the conventional and the cross SI are compared by the analysis of the modulation transfer function. As a result, the cross SI method shows similar resolution to conventional SI method. The CSICM has the two times enhanced lateral resolution than the conventional microscope, the optical sectioning ability and the fast image acquisition speed.