Local oscillator leakage reduction

Lee, Byungje; Lee, Hark-Yong; Kang, Gi-Cho; Lee, Ho‐Joon; Kim, Jong‐Heon; Lee, Jong‐Chul; Kim, Nam‐Young

doi:10.1002/mop.10183

Cited by 2 publications

(1 citation statement)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Local oscillator leakage is also an important source of distortion. When using vector signal generator at its maximum bandwidth setting, it is typical to observe what is known as generator local oscillator leakage [134]. Filtering out this undesired tone is critical in this stage, as it is the strongest noise component being produced by the digital signal generator.…”

Section: • Adjacent Channel Rejection (Typ >20 Db)mentioning

confidence: 99%

Advanced Techniques for Multipactor Testing

Belda¹

View full text Add to dashboard Cite

ehexgih igrxsi py wvsegy isxq ysr wonerris feld hesis dvisorX hrF iente iF fori isert hesis oEdvisorX hrF fenito qimeno wrt¡ %nez hh hesis presented t niversitt olit eni de l eni leniD tnury PHPQ Abstract sn the reent pstD there hs een prolifertion of new stellite systemsD espeilly the lrge onstelltions in the vow irth yrits @viysAF xerly ll stellites now rry digitl tr0 with vriety of modultions nd power levelsF xot only thtD the usiness model requires rpid deployment of stellitesD putting enormous onstrints for the suppliers of mirowve pylod hrdwreF e key risk re for suh equipment remins the multiptor rekdown under moderte to high power levelsF ywing to the inherent rndomness of the multiptor phenomenonD ustomers tend to dd extr design mrgins for the high power mirowve omponentsF his results in higher ostsD ulkier devies nd longer time for testingF fsed on personl experiene in multiptor testingD the prime motivtor for the work desried in the thesis hs een to undertke omprehensive review of this phenomenon nd develop utting edge multiptor test pilitiesD providing mens for the rpid multiptor testing under vriety of wideEnd modulted signlsF he thesis disserttion shows tht nlog nd digitl modultions hve signi(nt impt in the multiptor thresholdF he short nd longEterm multiptor regimes re lso nlyzedD regimes thtD in some sesD hve very di'erent multiptor thresholds for the sme ritil gpF he need to redue the mirowve pylod weight y using multirriers in single trnsponder provides n exellent option for designersF fy routing severl signls through the sme devieD the pylod weight is drmtilly reduedF gommeril solutions for multirrier testing re not suitle euse of the high power levels requiredF everl strtegies to implement multiptor test enhes with ontrollle prmeters re presentedF esults prove tht the signl eing fed to the devie under tests is urte nd stle over timeF pinllyD novel multiptor detetion system is proposed to ope with multiptor detetion when modulted nd multirrier signls of ny ndwidth re usedF his method hs the sme sensitivity s the well known mirowve nulling for ontinuous wve signls nd surpsses it for modulted signlsF he digitl signl proessing used to detet the multiptor ptterns provides full utonomous detetion methodF Contents eknowledgments v esum vi

show abstract

Section: • Adjacent Channel Rejection (Typ >20 Db)mentioning

confidence: 99%