Proceedings of ISAF-ECAPD-PFM 2012 2012
DOI: 10.1109/isaf.2012.6297795
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Local polarization in strontium barium niobate (SBN) epitaxial thin films investigated using Kelvin Force Microscopy (KFM)

Abstract: The Kelvin Force Microscopy technique is exploited to obtain quantitative information on the local polarization dependences in strontium barium niobate epitaxial thin films.

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