2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2024
DOI: 10.1109/ipfa61654.2024.10691262
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Logical Data Extraction of a STT-MRAM: Backside FIB Preparation and Conductive-AFM Measurements

Louise Dumas,
Guillaume Bascoul,
François Marc
et al.
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