“…Beside permanent degradation due to oxygen and water contamination, TFTs are well known to suffer from charge trapping, if a high enough prolonged bias is applied [24][25][26][27][28][29][30][31][32][33]. Moreover, bias effects are exacerbated by light [34][35][36][37][38][39][40][41]. In [39,40] we demonstrated that permanent degradation may occur also in unbiased OTFT devices exposed to light sources with high enough photon energy, e.g.…”