2000
DOI: 10.1117/12.397958
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<title>Applications of scanning laser source technique for detection of surface-breaking defects</title>

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Cited by 17 publications
(14 citation statements)
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“…The arrival time of signal R, nS and nR are t R ¼ 2.98 ms, t nS ¼ 3.60 ms and t nR ¼ 4.35 ms, respectively. Substituting t nR into Equation (10), the depth of the slot is obtained, which is h exp ¼ 1.96 mm. And then the orientation of the slot is calculated according to Equation (12), which is a exp ¼ 92.758.…”
Section: The Pulsed Dual Laser Source Techniquementioning
confidence: 99%
See 1 more Smart Citation
“…The arrival time of signal R, nS and nR are t R ¼ 2.98 ms, t nS ¼ 3.60 ms and t nR ¼ 4.35 ms, respectively. Substituting t nR into Equation (10), the depth of the slot is obtained, which is h exp ¼ 1.96 mm. And then the orientation of the slot is calculated according to Equation (12), which is a exp ¼ 92.758.…”
Section: The Pulsed Dual Laser Source Techniquementioning
confidence: 99%
“…In order to improve the crack detection capability, a Scanning Laser Source (SLS) technique was reported by Kromine et al [10]. A pulsed laser line source is employed to scan over the top surface of a specimen in the direction normal to the length of the line source.…”
Section: Introductionmentioning
confidence: 99%
“…In order to improve the crack detection capability, a scanning laser line source (SLLS) technique was reported by Kromine et al [9]. A pulsed laser line source is employed to scan over the top surface of a specimen in the direction normal to the length of the line source.…”
Section: Introductionmentioning
confidence: 99%
“…The signal enhancement effect represents a well-established concept in the non-contact ultrasonic inspection literature, especially for microcrack identification purposes. Kromine et al [18,19] first highlighted the phenomenon employing a pulsed laser for excitation and an interferometer for detection, providing a first example of the Scanning Laser Source (SLS) technique where the defect is scanned by the emitter (i.e., the emitter is moved in the defect proximity); a piezoelectric contact probe was also employed for the reception of Rayleigh and Lamb waves with λ = 0.6 mm to identify surface cracks with a depth ranging between 0.06 mm and 11 mm, as well as a notch on a turbine disk. While Kromine et al [19] reported an enhancement factor of two in correspondence of the crack, Blackshire and Sathish [20] subsequently reached an enhancement factor of four in case of Rayleigh wave excitation with λ = 0.3 mm by a piezoelectric contact probe and identification of defects with a depth down to 0.25 mm.…”
Section: Introductionmentioning
confidence: 99%
“…Kromine et al [18,19] first highlighted the phenomenon employing a pulsed laser for excitation and an interferometer for detection, providing a first example of the Scanning Laser Source (SLS) technique where the defect is scanned by the emitter (i.e., the emitter is moved in the defect proximity); a piezoelectric contact probe was also employed for the reception of Rayleigh and Lamb waves with λ = 0.6 mm to identify surface cracks with a depth ranging between 0.06 mm and 11 mm, as well as a notch on a turbine disk. While Kromine et al [19] reported an enhancement factor of two in correspondence of the crack, Blackshire and Sathish [20] subsequently reached an enhancement factor of four in case of Rayleigh wave excitation with λ = 0.3 mm by a piezoelectric contact probe and identification of defects with a depth down to 0.25 mm. From that moment, several analyses followed employing different strategies to exploit the signal enhancement effect: Boonsang and Dewhurst [21] first employed an EMAT as a receiver of Rayleigh waves to detect a 0.5 mm long and 1.5 mm deep normal surface slot (λ = 2.6 mm); Arias and Achenbach [17] introduced the concept of Scanning Laser Line Source (SLLS) in which the source laser spot of a typical SLS is focused on a line: by this solution, interaction between the thermally-induced elastic field and a finite length defect can be thoroughly studied by schematically referring to a simple 2D problem.…”
Section: Introductionmentioning
confidence: 99%