1993
DOI: 10.1016/0304-8853(93)91362-b
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Magnetic microstructure of sputtered Co-Cr films

Abstract: The magnetic microstructure of a thickness series of Co81Cr19 layers on Si3N 4 membranes is investigated by modified differential phase contrast (MDPC) microscopy. The development from cross-tie wall structures for a thickness < 25 nm to more complicated structures for a thickness > 50 nm is related to the macroscopic VSM measurements and the crystallite orientation determined from electron diffraction experiments.

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Cited by 2 publications
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“…A good example of the Lorentz microscopy images is given in Ref. 38, where the magnetic microstructure of the thin CoCr films was investigated. Images presented there are qualitatively very similar to those observed in our simulations, but again no quantitative comparison can be made.…”
Section: Variation Of the Exchange Coupling Strength Between The Neigmentioning
confidence: 99%
“…A good example of the Lorentz microscopy images is given in Ref. 38, where the magnetic microstructure of the thin CoCr films was investigated. Images presented there are qualitatively very similar to those observed in our simulations, but again no quantitative comparison can be made.…”
Section: Variation Of the Exchange Coupling Strength Between The Neigmentioning
confidence: 99%