1991
DOI: 10.1103/physrevb.43.6423
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Magneto-optics of multilayers with arbitrary magnetization directions

Abstract: Equations are derived for determining magneto-optic coefficients in multilayer systems with arbitrary directions of their magnetizations. The equations are cast in a matrix form that is suitable for numerical simulations. This establishes a framework for calculating the Kerr and Faraday effects for a multilayer system in much the same way as has been applied previously to the bulk. Numeri-0 cal Kerr results are presented for the following systems: bulk Fe, an overlayer of 50 A of Fe on Au, and for an Fe/Au sup… Show more

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Cited by 246 publications
(133 citation statements)
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“…We used the matrix formalism by Zak et al [41] with dz = 0.2 nm and refractive indices n Cu and n Co . The static MO constant q Co which enters the determination of ζ was determined experimentally to q Co = 0.017−i·0.020 by fitting the thickness dependent MO contrast and the ratio ǫ/θ for d = 2 − 20 nm (not shown).…”
Section: B Measurement Of the Spatio-temporal Magnetization Dynamicsmentioning
confidence: 99%
“…We used the matrix formalism by Zak et al [41] with dz = 0.2 nm and refractive indices n Cu and n Co . The static MO constant q Co which enters the determination of ζ was determined experimentally to q Co = 0.017−i·0.020 by fitting the thickness dependent MO contrast and the ratio ǫ/θ for d = 2 − 20 nm (not shown).…”
Section: B Measurement Of the Spatio-temporal Magnetization Dynamicsmentioning
confidence: 99%
“…Lee et al have given a theoretical formulation of x-ray resonant magnetic scattering [175,176] from rough surfaces and interfaces within the distorted-wave Born approximation. A matrix based formalism for magneto-optics with arbitrary magnetization direction has been developed by Zak et al [177,178,179]. It offers the possibility to calculate the specular reflectivity without any restrictions to the geometry, i.e.…”
Section: Specular Reflectivitymentioning
confidence: 99%
“…[178] needs the knowledge of the energy dependence of the refractive index n = 1 − (δ c + δ m ) + i(β c + β m ) with the charge contributions δ c and β c and the magnetic contributions δ m and β m (Fig. 7.9).…”
Section: X-ray Resonant Magnetic Reflectivitymentioning
confidence: 99%
“…We also note that in this limit, φ ′ and φ ′ + π yields exactly the same ρ CP . Thus, if we introduce the quantity 13) we find that in the dipole limit, without a Kerr effect, ∆ρ CP = 0. This is an important observation since we will see that when the sample is magnetic this symmetry is lost.…”
Section: Dipole Limitmentioning
confidence: 97%
“…This expression can be derived by the methods developed by Zak et al 13 There is also a contribution from the off-diagonal elements in the dielectric tensor to the s-to-s reflection coefficient. However, this contribution is exceedingly small since it depends on the square of ǫ 1 (ω) and we neglect it in the following.…”
Section: Surface Responsementioning
confidence: 99%