Measurement Setup for Physical Unclonable Functions

Biba, Josef; Boche, Silke; Sadek, Nezar-Hekmat; Hänsch, W.

doi:10.1109/icicm54364.2021.9660305

Cited by 1 publication

(10 citation statements)

References 21 publications

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“…If the measured capacitance is greater than this value, a logical 1 is stored. Should it be lower, a logical 0 is stored [15]. To divide the measured values in 4 sections, three decision values are required for the 2-bit key per capacitor.…”

Section: The Capacitor Structurementioning

confidence: 99%

“…All reported capacitive coating PUFs show a fluctuation that is too low. This circumstance would lead to exceptionally narrow decision values, which result in high error rates and unreliable keys [13,15].…”

Section: The Capacitor Structurementioning

confidence: 99%

“…• inhomogeneity of the SOG. In [15], we presented an electrical measurement setup to reliably measure the fluctuation in PUF MOS capacitors that has been introduced through processing. Hence, we used the 4980A LCR-Meter from Keysight and, to measure all chips on the wafer, a semiautomatic prober from Cascade.…”

Section: Optical Evaluation Of the Particle Layermentioning

confidence: 99%

“…This may be achieved by using certified and identifiable chips [11,12]. To accomplish this goal, coating PUFs seem to be a good solution [13,14,15]. These PUFs consist of a particle layer, which is spun on the chip and causes a change in the electrical readout.…”

Section: Introductionmentioning

confidence: 99%

“…This leads to changes in the bit string and, hence, to unreliable fingerprints. The change in design and measurement setup improved the reliability of the coating PUFs [15]. A further disadvantage of the coating PUFs is the following: Every measured capacitor adds just one bit to the key.…”

Section: Introductionmentioning

confidence: 99%

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Fabrication and Characterization of 2-Bit per Capacitor as Functional Structures for Physical Unclonable Function Circuits

Biba

Boche

Gossner

et al. 2022

IEEE J. Electron Devices Soc.

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Currently, security issues for semiconductor chips are counterfeiting and night shift problems. These factors might lead to insecure supply chains in the automotive industry. This can be avoided by using coating Physical Unclonable Functions (PUFs). The coating can be applied to every semiconductor chip in order to create a unique fingerprint. In this work, a 2-bit key per capacitor for Physical Unclonable Functions is presented for the first time. For this reason, 49 chips on a wafer with 195 metal oxide semiconductor (MOS) capacitors were fabricated. A large and random fluctuation of the capacitances was achieved by using a self-developed layer, which consisted of aluminum particles and spin-on glass. Due to the random variation in size and change in distribution of the particles, the fluctuation of capacitance varied from chip to chip and from wafer to wafer. The achieved large range in capacitance was used to create a 390-bit string out of 195 capacitors. Although the length of the bit string was doubled, the area of the structure remained constant. This led to a more secure PUF with a low error rate of 0.21 % and an inter-chip Hamming distance (HDinter) of 49 %.

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Section: The Capacitor Structurementioning

confidence: 99%

Section: The Capacitor Structurementioning

confidence: 99%

Section: Optical Evaluation Of the Particle Layermentioning

confidence: 99%