Measurements of the energy distribution of a high brightness rubidium ion beam

Haaf, G. ten; Wouters, S.H.W.; Nijhof, D.F.J.; Mutsaers, P.H.A.; Vredenbregt, E.J.D.

doi:10.1016/j.ultramic.2018.03.014

Cited by 4 publications

(1 citation statement)

References 23 publications

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“…18 In particular, sources using only transverse cooling have been demonstrated with great success in cesium 17,18,21 and rubidium. 22,23 These species benefit from efficient sub-Doppler cooling and can be formed into bright atomic beams. Basic laser cooling of lithium is less efficient, limiting the utility of transverse-only techniques.…”

Section: Introductionmentioning

confidence: 99%

Characterization of a high-brightness, laser-cooled Li+ ion source

Gardner

McGehee

McClelland

2019

Journal of Applied Physics

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Ion sources based on laser cooling have recently provided new pathways to high-resolution microscopy, ion milling, and ion implantation. Here, we present the design and detailed characterization of a 7Li magneto-optical trap ion source (MOTIS) with a peak brightness of (1.2 ± 0.2) × 105 A m−2 sr−1 eV−1 and a maximum continuous current over 1 nA. These values significantly surpass previous Li MOTIS performance benchmarks. Using simple models, we discuss how the performance of this system relates to fundamental operating limits. This source will support a range of projects using lithium ion beams for surface microscopy and nanostructure characterization, including Li+ implantation for studies of ionic transport in energy storage materials.

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Section: Introductionmentioning

confidence: 99%

Characterization of a high-brightness, laser-cooled Li+ ion source

Gardner

McGehee

McClelland

2019

Journal of Applied Physics

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Roadmap for focused ion beam technologies

Höflich,

Hobler,

Allen

et al. 2023

Applied Physics Reviews

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The focused ion beam (FIB) is a powerful tool for fabrication, modification, and characterization of materials down to the nanoscale. Starting with the gallium FIB, which was originally intended for photomask repair in the semiconductor industry, there are now many different types of FIB that are commercially available. These instruments use a range of ion species and are applied broadly in materials science, physics, chemistry, biology, medicine, and even archaeology. The goal of this roadmap is to provide an overview of FIB instrumentation, theory, techniques, and applications. By viewing FIB developments through the lens of various research communities, we aim to identify future pathways for ion source and instrumentation development, as well as emerging applications and opportunities for improved understanding of the complex interplay of ion–solid interactions. We intend to provide a guide for all scientists in the field that identifies common research interest and will support future fruitful interactions connecting tool development, experiment, and theory. While a comprehensive overview of the field is sought, it is not possible to cover all research related to FIB technologies in detail. We give examples of specific projects within the broader context, referencing original works and previous review articles throughout.

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Rubidium and Cesium Ion-Induced Electron and Ion Signals for Scanning Ion Microscopy Applications

Li,

Xu,

Loeber

et al. 2024

Microscopy and Microanalysis

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Scanning ion microscopy applications of novel focused ion beam (FIB) systems based on ultracold rubidium (Rb) and cesium (Cs) atoms were investigated via ion-induced electron and ion yields. Results measured on the Rb+ and Cs+ FIB systems were compared with results from commercially available gallium (Ga+) FIB systems to verify the merits of applying Rb+ and Cs+ for imaging. The comparison shows that Rb+ and Cs+ have higher secondary electron (SE) yields on a variety of pure element targets than Ga+, which implies a higher signal-to-noise ratio can be achieved for the same dose in SE imaging using Rb+/Cs+ than Ga+. In addition, analysis of the ion-induced ion signals reveals that secondary ions dominate Cs+ induced ion signals while the Rb+/Ga+ induced signals contain more backscattered ions.

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Measurements of the energy distribution of a high brightness rubidium ion beam

Cited by 4 publications

References 23 publications

Characterization of a high-brightness, laser-cooled Li+ ion source

Characterization of a high-brightness, laser-cooled Li+ ion source

Roadmap for focused ion beam technologies

Rubidium and Cesium Ion-Induced Electron and Ion Signals for Scanning Ion Microscopy Applications

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