2011
DOI: 10.1016/j.jmps.2011.06.009
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Mechanical response of multicrystalline thin films in mesoscale field dislocation mechanics

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Cited by 48 publications
(65 citation statements)
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“…Numerical results obtained from a finite element implementation of MFDM are in good qualitative agreement with experimental observations and some of the key physically relevant problems has been successfully solved and documented [9,10,11]. Motivated by the experimental observations [4,5], the effect of surface passivation, grain orientation, grain boundary constraints, and film thickness on the mechanical response of multicrystalline thin films is studied using MFDM in [12]. In this study, individual grains constituting the thin film are assumed to be of equal sizes.…”
Section: Introductionsupporting
confidence: 58%
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“…Numerical results obtained from a finite element implementation of MFDM are in good qualitative agreement with experimental observations and some of the key physically relevant problems has been successfully solved and documented [9,10,11]. Motivated by the experimental observations [4,5], the effect of surface passivation, grain orientation, grain boundary constraints, and film thickness on the mechanical response of multicrystalline thin films is studied using MFDM in [12]. In this study, individual grains constituting the thin film are assumed to be of equal sizes.…”
Section: Introductionsupporting
confidence: 58%
“…This is due to the accumulation of polar dislocations along grains boundaries as the misorientation between adjacent grains is high in this orientation set. This feature is discussed in detail in Puri et al [12].…”
Section: Orientation Setmentioning
confidence: 85%
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