2006
DOI: 10.31399/asm.cp.istfa2006p0457
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Metal Slice Defect Induced Package Level Reliability Failure

Abstract: In this paper, a case of package level reliability test failure was studied. A model of “Slice Defect”, which was identified as the root cause by failure analysis, is introduced. Experiment results are presented to approve that such model is in fact correct and the corrective actions are effective.

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