Methods Based on Multiple-Slit Fourier Transform Interferometry for Determining Thin-Film Optical Constants in the VUV/Soft X-Ray Range

Tatchyn, R.

doi:10.1016/b978-0-08-055630-7.50014-6

Handbook of Optical Constants of Solids 1998

DOI: 10.1016/b978-0-08-055630-7.50014-6

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Methods Based on Multiple-Slit Fourier Transform Interferometry for Determining Thin-Film Optical Constants in the VUV/Soft X-Ray Range

R. Tatchyn¹

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Methods Based on Multiple-Slit Fourier Transform Interferometry for Determining Thin-Film Optical Constants in the VUV/Soft X-Ray Range

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References 28 publications

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