Abstract:Electronic speckle pattern interferometry is useful for the qualitative depiction of the deformation profile of harmonically vibrating objects. However, extending the process to achieve quantitative results requires unwrapping the phase in the interferogram, which contains significant noise due to the speckle. Two methods to achieve accurate phase information from time-averaged speckle pattern interferograms are presented. The first is based on a direct inverse of the regions within corresponding phase interva… Show more
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