2013 22nd International Conference on Noise and Fluctuations (ICNF) 2013
DOI: 10.1109/icnf.2013.6578938
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Microplasmas avalanche breakdown as a diagnostic tool and reliability appreciating of the INGAN/GAN high-power LEDs

Abstract: Microplasmas breakdown of the InGaN/GaN heterostructures of different types of high-power light-emitting diodes is studied. It is shown that microplasma parameters, connected with reliability and such fabricating technology of the InGaN/GaN heterostructures as substrate material -Al 2 O 3 , SiC or Si, which determines the density of the critical extended defects, light flux, homogeneity of current spreading.

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